Conformations of long deoxyribonucleic acid molecule on silicon surface observed by atomic force microscopy

被引：5
|
作者：
Ueda, M [1 ]
Kawai, T [1 ]
Iwasaki, H [1 ]
机构：
[1] Osaka Univ, Inst Sci & Ind Res, ISIR, Ibaraki, Osaka 567, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1998年 / 37卷 / 6A期
关键词：
DNA; silicon; AFM; step bunching; polyamine; supercoil;
D O I：
10.1143/JJAP.37.3506
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
By means of atomic force microscopy (AFM), the conformational structures of the circular double-stranded Deoxyribonucleic Acid (DNA) (2.96 kilobase pairs) on step-controlled silicon surface are studied. The DNA molecules observed an the terrace region maintain the supercoiled structure. On the other hand, the DNA molecules observed on the step-hunched region have a modified higher-order structure. Thus, we clarify that the conformations of long DNA are affected by the surface morphology of the substrate.
引用
收藏
页码：3506 / 3507
页数：2
相关论文
共 50 条
  • [1] Conformations of succinoglycan as observed by atomic force microscopy
    Balnois, E
    Stoll, S
    Wilkinson, KJ
    Buffle, J
    Rinaudo, M
    Milas, M
    [J]. MACROMOLECULES, 2000, 33 (20) : 7440 - 7447
  • [2] Influence of silicon surface structure on long deoxyribonucleic acid molecule alignment
    Xiao, ZW
    Xu, MX
    Ohgi, T
    Fujita, D
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2003, 42 (7B): : 4748 - 4751
  • [3] Extended, relaxed, and condensed conformations of hyaluronan observed by atomic force microscopy
    Cowman, MK
    Spagnoli, C
    Kudasheva, D
    Li, M
    Dyal, A
    Kanai, S
    Balazsy, EA
    [J]. BIOPHYSICAL JOURNAL, 2005, 88 (01) : 590 - 602
  • [4] Surface-dependent conformations of human fibrinogen observed by atomic force microscopy under aqueous conditions
    Sit, PS
    Marchant, RE
    [J]. THROMBOSIS AND HAEMOSTASIS, 1999, 82 (03) : 1053 - 1060
  • [5] Atomic force microscopy of silicon stepped surface
    Kosolobov, SS
    Nasimov, DA
    Sheglov, DV
    Rodyakina, EE
    Latyshev, AV
    [J]. PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2002, 5-6 : 231 - 237
  • [6] Distorted surface topography observed by atomic force microscopy
    Li, LA
    Liu, RP
    Xu, Z
    Xu, Y
    Wang, WK
    Fan, CZ
    [J]. MEASUREMENT, 2006, 39 (01) : 12 - 15
  • [7] Conformations, flexibility, and interactions observed on individual membrane proteins by atomic force microscopy
    Müller, DJ
    Engel, A
    [J]. ATOMIC FORCE MICROSCOPY IN CELL BIOLOGY, 2002, 68 : 257 - 299
  • [8] SURFACE-MORPHOLOGY OF ARSENIC IMPLANTED SILICON DIOXIDE OBSERVED BY ATOMIC-FORCE MICROSCOPY
    WONG, TKS
    WILSON, IH
    [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1994, 91 (1-4): : 639 - 643
  • [9] Silicon surface morphology study by atomic force microscopy
    Gerasimova, O
    Boragno, C
    Borisov, S
    Valbusa, U
    [J]. PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2002, 9-10 : 35 - 41
  • [10] Surface structure of deciduous enamel observed by atomic force microscopy
    Motoyama, M
    Daito, M
    Uemura, M
    Kambara, M
    [J]. JOURNAL OF DENTAL RESEARCH, 1998, 77 : 715 - 715
12345