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Mesh-shape-and-size controlled rapid-melting growth for the formation of single-crystalline (100), (110), and (111) Ge networks on insulators
被引:20
|作者:
Mizushima, Ichiro
[1
]
Toko, Kaoru
[2
]
Ohta, Yasuharu
[2
]
Sakane, Takashi
[2
]
Sadoh, Taizoh
[2
]
Miyao, Masanobu
[2
]
机构:
[1] STARC, Yokohama, Kanagawa 2200033, Japan
[2] Kyushu Univ, Dept Elect, Fukuoka 8190395, Japan
关键词:
GERMANIUM-ON-INSULATOR;
LIQUID-PHASE EPITAXY;
P-CHANNEL MOSFETS;
SOURCE/DRAIN;
SUBSTRATE;
MOBILITY;
D O I:
10.1063/1.3586259
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Single-crystalline-Ge (c-Ge) networks with various crystal orientations on insulators formed on Si substrates are essential for integrating high-speed and multifunctional devices onto the Si platform. c-Ge networks are realized by rapid-melting growth of mesh-patterned amorphous-Ge over large areas (500 X 250 mu m(2)) on (110) and (111) as well as (100) Si substrates by optimizing the shape and the size of the mesh. It is revealed that latent-heat generated at the growth front can be controlled by selecting mesh-shape-and-size, which suppresses the spontaneous nucleation. In addition, essential role of the growth-direction on preventing the rotational growth is clarified. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3586259]
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