Total-dose and single-event effects in DC/DC converter control circuitry

被引：20
|
作者：
Adell, PC
Schrimpf, RD
Holman, WI
Boch, J
Stacey, J
Ribero, P
Sternberg, A
Galloway, KF
机构：
[1] Vanderbilt Univ, Radiat Effects & Reliabil Grp, Nashville, TN 37235 USA
[2] TRAD, F-31319 Labege, France
来源：
IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2003年 / 50卷 / 06期
关键词：
DC/DC power converter; design hardening technique; pulse width modulation; SG1525A; single-event effects; single-event transient; total dose;
D O I：
10.1109/TNS.2003.820757
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Total-dose and single-event effects in the linear control circuitry of DC/DC power converters are examined. Catastrophic failure, induced by error-amplifier total-dose irradiation, is compared for two modes of operation. The use of a more robust restart mechanism to maintain the operation of the converter at a much higher dose level is presented. Single events result in missing pulses at the output of the control circuitry. Hybrid and integrated (SG1525A) pulse width modulators are evaluated to illustrate the missing-pulse results.
引用
收藏
页码：1867 / 1872
页数：6
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