High temperature IR-Imager with wide dynamic range for industrial process control

被引:0
|
作者
Hoffmann, Uwe [1 ]
Hofmann, G. [1 ]
Wassilew, D. [1 ]
Hess, N. [1 ]
Zimmerhackl, M. [1 ]
机构
[1] DIAS Infrared GmbH, D-01217 Dresden, Germany
来源
THERMOSENSE XXX | 2008年 / 6939卷
关键词
IR-Imager; NIR; Thermal imager; wide temperature range; high dynamic range; industrial process control;
D O I
10.1117/12.777530
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
State of the art IR-Imager in the near infrared spectral range for monitoring high temperatures in industrial applications are characterized by a number of small measurement ranges. Scenes with a high temperature contrast require several measures switching between these ranges and result in pictures with under range and saturated parts. A newly developed high temperature IR-Imager with a spectral range in the near infrared provides a wide dynamic range by utilizing specialized signal processing. A continuous temperature measurement range from 600 degrees C up to 1500 degrees C is realized with a resolution of 640x480 points and a measuring frequency of 25Hz. Each resulting image contains the full dynamic range and is transmitted via a Fast Ethernet interface in real time.
引用
收藏
页码:U13 / U20
页数:8
相关论文
共 50 条
  • [31] High-temperature IR radiation conductivity of industrial glasses
    van Nijnatten, PA
    Broekhuijse, JT
    Faber, AJ
    59TH CONFERENCE ON GLASS PROBLEMS, 1999, 20 (01): : 47 - 56
  • [32] High-temperature spectral emissivity of SiC in the IR range
    Zolotarev, V. M.
    OPTICS AND SPECTROSCOPY, 2007, 103 (04) : 592 - 602
  • [33] A high precision temperature control system for CMOS integrated wide range resistive gas sensors
    Ferri, G
    Stornelli, V
    ANALOG INTEGRATED CIRCUITS AND SIGNAL PROCESSING, 2006, 47 (03) : 293 - 301
  • [34] High Dynamic Range Organic Temperature Sensor
    Ren, Xiaochen
    Chan, Paddy K. L.
    Lu, Jianbiao
    Huang, Baoling
    Leung, Dennis C. W.
    ADVANCED MATERIALS, 2013, 25 (09) : 1291 - 1295
  • [35] High-temperature spectral emissivity of SiC in the IR range
    V. M. Zolotarev
    Optics and Spectroscopy, 2007, 103 : 592 - 602
  • [36] A high precision temperature control system for CMOS integrated wide range resistive gas sensors
    Giuseppe Ferri
    Vincenzo Stornelli
    Analog Integrated Circuits and Signal Processing, 2006, 47 : 293 - 301
  • [37] A PLANT-WIDE INDUSTRIAL-PROCESS CONTROL PROBLEM
    DOWNS, JJ
    VOGEL, EF
    COMPUTERS & CHEMICAL ENGINEERING, 1993, 17 (03) : 245 - 255
  • [38] A PLANT-WIDE INDUSTRIAL PROCESS CONTROL SECURITY PROBLEM
    McEvoy, Thomas
    Wolthusen, Stephen
    CRITICAL INFRASTRUCTURE PROTECTION V, 2011, 367 : 47 - 56
  • [39] Test Results from an Imager for Scenes with High Dynamic Range and Low Light Levels
    Osterman, D. P.
    Good, W.
    Philbrick, R.
    Schneider, L.
    Johnson, P.
    Kaptchen, P.
    Narciso, M.
    EARTH OBSERVING SYSTEMS XV, 2010, 7807
  • [40] Compact multi-band (VIS/IR) zoom imager for high resolution long range surveillance
    Bodkin, A
    Sheinis, A
    McCann, J
    Infrared Technology and Applications XXXI, Pts 1 and 2, 2005, 5783 : 816 - 826