Microchannel plate life testing for UV spectroscopy instruments

被引：1

作者：

Darling, N. T. ^{[1
]}

Siegmund, O. H. W. ^{[1
]}

Curtis, T. ^{[1
]}

McPhate, J. ^{[1
]}

Tedesco, J. ^{[1
]}

Courtade, S. ^{[1
]}

Holsclaw, G. ^{[2
]}

Hoskins, A. ^{[2
]}

Al Dhafri, S. ^{[3
]}

Amiri, S. ^{[3
]}

机构：

[1] Univ Calif Berkeley, Space Sci Lab, 7 Gauss Way, Berkeley, CA 94720 USA

[2] Univ Colorado, LASP, 1234 Innovat Dr, Boulder, CO 80303 USA

[3] Mohammed Bin Rashid Space Ctr, Al Khawaneej St, Dubai, U Arab Emirates

来源：

UV, X-RAY, AND GAMMA-RAY SPACE INSTRUMENTATION FOR ASTRONOMY XX | 2017年 / 10397卷

关键词：

Emirates Mars Mission UV Spectrograph; FUV; microchannel plate; cross delay line; scrub;

D O I：

10.1117/12.2277343

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

The Emirates Mars Mission (EMM) UV Spectrograph (EMUS) is a far ultraviolet (102 nm to 170 nm) imaging spectrograph for characterization of the Martian exosphere and thermosphere. Imaging is accomplished by a photon counting open-face microchannel plate (MCP) detector using a cross delay line (XDL) readout. An MCP gain stabilization ("scrub") followed by lifetime spectral line burn-in simulation has been completed on a bare MCP detector at SSL. Gain and sensitivity stability of better than 7% has been demonstrated for total dose of 2.5 x 10(12) photons cm(-2) (2 C . cm(-2)) at 5.5 kHz mm(-2) counting rates, validating the efficacy of an initial low gain full-field scrub.

引用

页数：7

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