Why small avalanche photodiodes are beautiful

被引:6
|
作者
Rees, GJ [1 ]
David, JPR [1 ]
机构
[1] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England
关键词
impact ionisation; avalanche multiplication; nonlocal; dead space; APD; speed; noise;
D O I
10.1117/12.482482
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Conventional wisdom suggests that, for low avalanche noise, avalanche photodiodes should operate at low electric fields, where electron and hole ionisation coefficients can differ widely. However, the associated weak ionisation requires long multiplication regions, which in turn demand high bias voltages and result in long carrier transit times, reducing device speed. Moreover, multiplication is particularly sensitive to temperature in this region. In this paper we discuss the effects of dead space on reducing noise in short devices and on the associated benefits in predicted response time and reduced temperature sensitivity. The paper is illustrated with work from the Sheffield group.
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页码:349 / 362
页数:14
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