FEM analysis of current limiting characteristics of a superconducting thin film current limiting device by the current vector potential method

被引:14
|
作者
Sugita, S [1 ]
Ohsaki, H
机构
[1] Univ Tokyo, Sch Engn, Dept Elect Engn, Tokyo 1138656, Japan
[2] Univ Tokyo, Grad Sch Frontier Sci, Tokyo 1130033, Japan
关键词
coupled problem analysis; finite element method; superconducting fault current limiter; superconducting thin film;
D O I
10.1109/TASC.2003.812972
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Numerical analysis of a resistive superconducting fault current limiter (SFCL), using superconducting thin film has been performed. The finite element method (FEM) based on the current vector potential with the thin plate approximation was used to study current limiting characteristics and current imbalance phenomenon of a single SFCL device. Transport current and temperature dependence were also taken into account by solving a three-dimensional coupled problem of electromagnetic field, an electric circuit and thermal Held. An E-J relation based on the power law was adopted for modeling the electromagnetic property of superconductor. This analysis method enables to calculate not only current limiting characteristics but also current density, flux density, and heat generation at any point in the superconducting thin film at any time.
引用
收藏
页码:2020 / 2023
页数:4
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