Effect of sidewall modification in the determination of friction coefficient of vertically aligned carbon nanotube films using friction force microscopy

被引:19
|
作者
Ler, J. G. Q. [1 ]
Hao, Yufeng [1 ]
Thong, J. T. L. [1 ]
机构
[1] Natl Univ Singapore, Dept Elect & Comp Engn, Singapore 117576, Singapore
关键词
D O I
10.1016/j.carbon.2007.09.038
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The significance of the sidewall surface of vertically aligned carbon nanotubes (VACNTs) and the effect of humidity in the determination of VACNT film friction coefficient have been investigated. VACNT films of 2 mu m thick were sidewall-modified by means of CF4 and O-2 plasma treatments, and verified for the functionalization of the sidewalls. They were then characterized for wettability properties, as well as friction coefficient using friction force microscopy at different humidity levels. It was found that humidity had insignificant effect on the friction coefficient, and sidewall friction formed a major component of the friction force experienced by the tip. Sidewall modifications resulted in friction coefficient changes of up to 50%. (C) 2007 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2737 / 2743
页数:7
相关论文
共 43 条
  • [31] Estimation of the linear thermal expansion coefficient in friction-deposited, oriented poly(tetrafluoroethylene) films by temperature-dependent lateral force microscopy
    Forster, S
    Liu, GB
    Vancso, GJ
    [J]. POLYMER BULLETIN, 1996, 36 (04) : 471 - 476
  • [32] The effect of the substrate bias on structure and friction coefficient of tetrahedral amorphous carbon films deposited by filtered cathodic vacuum arc
    Liang, Han
    Wei, Yang
    Bin, Cui
    [J]. PROCEEDINGS OF THE 2017 6TH INTERNATIONAL CONFERENCE ON MEASUREMENT, INSTRUMENTATION AND AUTOMATION (ICMIA 2017), 2017, 154 : 605 - 609
  • [33] Friction force microscopy using silicon cantilevers covered with organic monolayers via silicon-carbon covalent bonds
    Ara, M
    Tada, H
    [J]. APPLIED PHYSICS LETTERS, 2003, 83 (03) : 578 - 580
  • [34] Determination of the electrostatic lever arm of carbon nanotube field effect transistors using Kelvin force microscopy (vol 94, 223508, 2009)
    Brunel, David
    Deresmes, Dominique
    Melin, Thierry
    [J]. APPLIED PHYSICS LETTERS, 2009, 95 (15)
  • [35] MEASUREMENT OF FRICTION FORCE BETWEEN DIRECTLY INTEGRATED CARBON NANOTUBE BUNDLES IN TIP-TO-TIP CONTACT USING MEMS TRIBOMETER PLATFORM
    Kim, Wondo
    Jo, Eunhwan
    Lee, Jae-Ik
    Kim, Jongbaeg
    [J]. 2019 IEEE 32ND INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS (MEMS), 2019, : 845 - 848
  • [36] Fabrication and atomic force micro scopy/friction force microscopy (AFM/FFM) studies of polyacrylamide-carbon nanotubes (PAM-CNTs) copolymer thin films
    Li, XF
    Guan, WC
    Yan, HB
    Huang, L
    [J]. MATERIALS CHEMISTRY AND PHYSICS, 2004, 88 (01) : 53 - 58
  • [37] Spatial recognition of defects and tube type in carbon nanotube field effect transistors using electrostatic force microscopy
    Ibrahim, Imad
    Ruemmeli, Mark H.
    Ranjan, Nitesh
    Buechner, Bernd
    Cuniberti, Gianaurelio
    [J]. NANOTECHNOLOGY, 2013, 24 (23)
  • [38] Surface potential measurement of carbon nanotube field-effect transistors using Kelvin probe force microscopy
    Umesaka, Takeo
    Ohnaka, Hirofumi
    Ohno, Yutaka
    Kishimoto, Shigeru
    Maezawa, Koichi
    Mizutani, Takashi
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2007, 46 (4B): : 2496 - 2500
  • [39] Chemical and physical analysis of reaction films formed by molybdenum dialkyl-dithiocarbamate friction modifier additive using Raman and atomic force microscopy
    Miklozic, KT
    Graham, J
    Spikes, H
    [J]. TRIBOLOGY LETTERS, 2001, 11 (02) : 71 - 81
  • [40] Chemical and physical analysis of reaction films formed by molybdenum dialkyl-dithiocarbamate friction modifier additive using Raman and atomic force microscopy
    Miklozic K.T.
    Graham J.
    Spikes H.
    [J]. Tribology Letters, 2001, 11 (2) : 71 - 81