Development of a CMOS low-noise analog front-end ASIC for X-ray imaging applications

被引：0
|
作者：
Zervakis, E [1 ]
Loukas, D [1 ]
Haralabidis, N [1 ]
Pavlidis, A [1 ]
机构：
[1] Natl Tech Univ Athens, Microelect Circuit Design Grp, Athens, Greece
来源：
PROCEEDINGS OF THE 2003 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOL IV: DIGITAL SIGNAL PROCESSING-COMPUTER AIDED NETWORK DESIGN-ADVANCED TECHNOLOGY | 2003年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
High density compound materials (CdTe, GaAs, Hgl(2)) are currently evaluated as direct photon conversion sensors for applications in X-ray imaging. A new front-end stage has been designed with the aim to be implemented as readout chain in a luggage inspection system based on a linear array of CdTe sensors. Both types of electron or hole collecting CdTe sensors will be evaluated. Each detecting element is characterized by leakage current smaller than 5nA/mm(2) at working point and capacitance in the range of 0.5pF. A low noise front-end chain has been developed based on the voltage mode architecture. The operation of the front-end. stage is optimized for a 2pF capacitance, system input capacitance, and for energy range of 20-220keV. A prototype ASIC has been fabricated in a commercial 0.6um CMOS process.
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页码：764 / 767
页数：4
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