Ion-Irradiated Laterally Graded Ni/C Multilayers: A Combined X-ray Standing Wave and X-ray Reflectivity Analysis

被引:2
|
作者
Dev, Bhupendra Nath [1 ]
Roy, Sumalay [1 ]
Bera, Sambhunath [2 ]
Tawara, Yuzuru [3 ]
Schell, Norbert [4 ]
Grenzer, Joerg [4 ]
von Borany, Johannes [4 ]
Groetzschel, Rainer [4 ]
机构
[1] Indian Assoc Cultivat Sci, Dept Mat Sci, Kolkata 700032, India
[2] Inst Phys, Bhubaneswar 751005, Orissa, India
[3] Nagoya Univ, Dept Phys, Nagoya, Aichi 4648602, Japan
[4] Forschungszentrum Dresden Rossendorf, Inst Ion Beam Phys & Mat Res, D-01314 Dresden, Germany
关键词
CO/PT MULTILAYERS; GIANT MAGNETORESISTANCE; BEAM IRRADIATION; CO/CU NANOSTRUCTURES; GALLIUM IRRADIATION; MAGNETIC-PROPERTIES; FILMS; EVOLUTION; MEDIA;
D O I
10.1143/JJAP.50.052501
中图分类号
O59 [应用物理学];
学科分类号
摘要
An X-ray standing wave (XSW) experimental facility was set up at the Rossendorf Beam Line (ROBL) at the European Synchrotron Radiation Facility (ESRF). Using this facility, the microstructures and ion-beam induced microstructural modifications of a nanoscale laterally graded Ni/C multilayer systems have been studied by the combined X-ray reflectivity (XRR) and XSW technique. The multilayer stack with 15 Ni/C layer pairs was fabricated on a glass substrate by ion beam sputtering. A 2MeV Cu2+ ion beam was rastered on the samples to obtain uniformly irradiated strips with fluences from 1 x 10(14) to 7 x 10(14) ions/cm(2). We have observed that X-ray reflectivity at the first order Bragg peak gradually increases due to increase in multilayer period in the virgin samples. The multilayer period has expanded and interfaces broadened due to ion irradiation. Xray standing wave analysis indicates that, during deposition, a significant amount of Ni diffuses into C layers. Up to a certain fluence, we have observed that more and more Ni atoms are incorporated into C layers. At higher fluences, Ni is progressively segregated from the C layers. These mixing and demixing phenomena of Ni in C layers as a function of ion fluence have been explained in terms of two competitive processes including ballistic mixing and chemically guided atomic movements. (C) 2011 The Japan Society of Applied Physics
引用
收藏
页数:6
相关论文
共 50 条
  • [1] Layered synthetic microstructures: Importance of a combined X-ray standing wave and X-ray reflectivity analysis
    Dev, BN
    [J]. PHYSICS AT SURFACES AND INTERFACES, 2003, : 109 - 120
  • [2] X-RAY REFLECTIVITY OF FIBONACCI MULTILAYERS
    DOMINGUEZADAME, F
    MACIA, E
    [J]. PHYSICS LETTERS A, 1995, 200 (01) : 69 - 72
  • [3] Characterization of multilayers by Fourier analysis of x-ray reflectivity
    Voorma, HJ
    Louis, E
    Koster, NB
    Bijkerk, F
    Spiller, E
    [J]. JOURNAL OF APPLIED PHYSICS, 1997, 81 (09) : 6112 - 6119
  • [4] X-RAY STANDING WAVES IN MULTILAYERS
    Zheludeva, S.
    Kovalchuk, M. V.
    Novikova, N. N.
    [J]. ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C40 - C40
  • [5] Laterally graded multilayer optics for x-ray analysis
    Schuster, M
    Göbel, H
    Brügemann, L
    Bahr, D
    Burgäzy, F
    Michaelsen, C
    Störmer, M
    Ricardo, P
    Dietsch, R
    Holz, T
    Mai, H
    [J]. EUV, X-RAY, AND NEUTRON OPTICS AND SOURCES, 1999, 3767 : 183 - 198
  • [6] Ion distribution in polyelectrolyte multilayers with standing-wave X-ray fluorescence
    Schollmeyer, Hauke
    Guenoun, Patrick
    Daillant, Jean
    Novikov, Dmitri V.
    Von Klitzing, Regine
    [J]. JOURNAL OF PHYSICAL CHEMISTRY B, 2007, 111 (16): : 4036 - 4042
  • [7] Standing wave approach in the theory of X-ray magnetic reflectivity
    Andreeva, M. A.
    Baulin, R. A.
    Repchenko, Yu. L.
    [J]. JOURNAL OF SYNCHROTRON RADIATION, 2019, 26 : 483 - 496
  • [8] Standing wave approach in the theory of X-ray magnetic reflectivity
    Andreeva, M.A.
    Baulin, R.A.
    Repchenko, Yu. L.
    [J]. Journal of Synchrotron Radiation, 2019, 26 (02) : 483 - 496
  • [9] The interface study of photoresist/underlayer using hybrid x-ray reflectivity and x-ray standing wave approach
    Tiwari, Atul
    Fallica, Roberto
    Ackermann, Marcelo D.
    Makhotkin, Igor A.
    [J]. METROLOGY, INSPECTION, AND PROCESS CONTROL XXXVIII, 2024, 12955
  • [10] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE FEATURES IN THE REFLECTIVITY OF X-RAY MULTILAYERS
    VANBRUG, H
    VANDERWIEL, MJ
    BRUIJN, MP
    VERHOEVEN, J
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 2028 - 2029