Stress Testing Advanced RAIM Airborne Algorithms

被引：4
|
作者：
Blanch, Juan [1 ]
Walter, Todd [1 ]
机构：
[1] Stanford Univ, Stanford, CA 94305 USA
来源：
PROCEEDINGS OF THE 2020 INTERNATIONAL TECHNICAL MEETING OF THE INSTITUTE OF NAVIGATION | 2020年
关键词：
D O I：
10.33012/2020.17153
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We describe a methodology to test the integrity of Advanced RAIM algorithms through simulation. To this purpose we describe near worst-case fault magnitudes for multiple simultaneous faults, demonstrate through a set of examples that these faults do indeed achieve close to the worst case integrity risk, and propose an outline of the offline tests to demonstrate the integrity of ARAIM airborne algorithms based on these fault profiles.
引用
收藏
页码：421 / 439
页数：19
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