Preparation and characterization of microcrack-free thick YBa2CU3O7-δ films

被引：4

作者：

Xiong Jie ^{[1
]}

Qin Wenfeng ^{[1
]}

Tang Jinlong ^{[1
]}

Tao Bowan ^{[1
]}

Cui Xumei ^{[1
]}

Li Yanrong ^{[1
]}

机构：

[1] Univ Elect Sci & Technol China, State Key Lab Elect Thin Films & Integrated Devic, Chengdu 610054, Peoples R China

来源：

RARE METALS | 2007年 / 26卷 / 05期

关键词：

YBCO superconducting film; microcrack-free thick film; critical current density; direct-current sputtering method;

D O I：

10.1016/S1001-0521(07)60236-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

High quality epitaxial YBa2Cu3O7-delta (YBCO) superconducting films were fabricated on (00l) LaAlO3 substrates using the direct-current sputtering method. The attainment of an unusually high film thickness (up to 2.0 mu m) without microcracking was attributed in part to the presence of pores correlated with yttrium-rich composition in the films. The influence of the film thickness on the microstructure was investigated by X-ray diffraction conventional scan (theta-2 theta, omega-scan, pole figure) and high-resolution reciprocal space mapping. The films were c-axis oriented with no a-axis-oriented grains up to the thickness of 2 mu m. The surface morphology and the critical current density (J(c)) strongly depended on the film thickness. Furthermore, the reasons for these thickness dependences were elucidated in detail.

引用

页码：403 / 407

页数：5

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