Detector Performance of Ammonium-Sulfide-Passivated CdZnTe and CdMnTe Materials

被引:2
|
作者
Kim, K. H. [1 ]
Bolotnikov, A. E. [1 ]
Camarda, G. S. [1 ]
Marchini, L. [1 ]
Yang, G. [1 ]
Hossain, A. [1 ]
Cui, Y. [1 ]
Xu, L. [1 ]
James, R. B. [1 ]
机构
[1] Brookhaven Natl Lab, Upton, NY 11973 USA
关键词
Passivation; CdZnTe; CdMnTe; ammonium sulfide; leakage current;
D O I
10.1117/12.861543
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Dark currents, including those in the surface and bulk, are the leading source of electronic noise in X-ray and gamma detectors, and are responsible for degrading a detector's energy resolution. The detector material itself determines the bulk leakage current; however, the surface leakage current is controllable by depositing appropriate passivation layers. In previous research, we demonstrated the effectiveness of surface passivation in CZT (CdZnTe) and CMT (CdMnTe) materials using ammonium sulfide and ammonium fluoride. In this research, we measured the effect of such passivation on the surface states of these materials, and on the performances of detectors made from them.
引用
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页数:6
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