Demerit-GWMA Control Chart for Demerit Statistics

被引:2
|
作者
Kang, Hae Woon [1 ]
Kang, Chang Wook [2 ]
Baik, Jae Won [1 ]
Nam, Sung Ho [3 ]
机构
[1] Hanyang Univ, Dept Ind Engn, Seoul, South Korea
[2] Hanyang Univ, Dept Informat & Ind Engn, Seoul, South Korea
[3] Korea Inst Ind Technol, Dept Mfg Convergence R&D, Cheonan, South Korea
来源
关键词
Control chart; Demerit; Exponentially weighted moving average; Generally weighted moving average; Statistical process control(SPC);
D O I
10.4028/www.scientific.net/AMR.156-157.413
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A classical Demerit control chart is used to monitor the process through which various types of defects in complex products, such as automobiles, computers, mobile phones, etc. are found in general. As a technique for rapidly detecting small shifts of the process mean in the control chart, the EWMA(exponentially weighted moving average) technique is very effective. This study suggested the Demerit-GWMA control chart, combining the GWMA(generally weighted moving average) technique, which shows better performance than EWMA technique in detecting small shifts of process mean, into the classical Demerit control chart, and evaluated its performance. Through the evaluation of its performance, it was found that the Demerit-GWMA control chart is more sensitive than both the classical Demerit control chart and the Demerit-EWMA control chart in detecting small shifts of process mean.
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页码:413 / +
页数:2
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