Characteristics of green light-emitting diodes using an InGaN:Mg/GaN:Mg superlattice as p-type hole injection and contact layers

被引:12
|
作者
Liu, J. P. [1 ,2 ]
Limb, J. B. [1 ,2 ]
Ryou, J. -H. [1 ,2 ]
Lee, W. [1 ,2 ]
Yoo, D. [1 ,2 ,3 ]
Horne, C. A. [1 ,2 ]
Dupuis, R. D. [1 ,2 ,3 ]
机构
[1] Georgia Inst Technol, Ctr Compound Semicond, Atlanta, GA 30332 USA
[2] Georgia Inst Technol, Sch Elect & Comp Engn, Atlanta, GA 30332 USA
[3] Georgia Inst Technol, Sch Mat Sci & Engn, Atlanta, GA 30332 USA
关键词
light-emitting diode (LED); gallium nitride (GaN); metalorganic chemical vapor deposition (MOCVD); InGaN; green LED;
D O I
10.1007/s11664-007-0355-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Mg-doped InGaN/GaN p-type short-period superlattices (SPSLs) are developed for hole injection and contact layers of green light-emitting diodes (LEDs). V-defect-related pits, which are commonly found in an InGaN bulk layer, can be eliminated in an InGaN/GaN superlattice with thickness and average composition comparable to those of the bulk InGaN layer. Mg-doped InGaN/GaN SPSLs show significantly improved electrical properties with resistivity as low as similar to 0.35 ohm-cm, which is lower than that of GaN:Mg and InGaN:Mg bulk layers grown under optimized growth conditions. Green LEDs employing Mg-doped InGaN/GaN SPSLs for hole injection and contact layers have significantly lower reverse leakage current, which is considered to be attributed to improved surface morphology. The peak electroluminescence intensity of LEDs with a SPSL is compared to that with InGaN:Mg bulk hole injection and contact layers.
引用
收藏
页码:558 / 563
页数:6
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