On the theory of x-ray diffractional laue focusing on two bent crystals

被引：0
|
作者：
Tchen, T [1 ]
机构：
[1] Moscow State Acad Fine Chem Technol, Moscow 117571, Russia
来源：
JOURNAL OF RUSSIAN LASER RESEARCH | 2003年 / 24卷 / 05期
关键词：
bent crystal; Laue diffraction; diffractional focusing of x-rays; x-ray spectroscopy; x-ray microscopy;
D O I：
10.1023/A:1025820109731
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
The Laue focusing of a spherical x-ray wave onto dynamical diffraction by a double-bent crystal system is studied. The geometrical equations of two-dimensional Laue focusing and the intensity distribution formula are derived. A high sensitivity of the two-dimensional Laue focusing to the crystal thickness and bending radii difference is revealed. It is shown that this sensitivity can be used to control the crystal thickness with accuracy up to 100 Angstrom and bending radii Up to similar to10(-2) m. The focusing process of the spherical wave inside crystals as well as in vacuum is investigated. The possibility of using the two-crystal Laue system as a lens for x-ray microscopy is studied. The spectral characteristics of a twice-diffracted wave are discussed. The spectral resolution is demonstrated to be 10(6).
引用
收藏
页码：445 / 457
页数：13
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