Comparison of Ionic Liquid and Ion-Gel Top-Gate MoS2 Field-Effect Transistors

被引:1
|
作者
Oh, Guen Hyung
Kim, TaeWan [1 ]
机构
[1] Jeonbuk Natl Univ, Dept Elect Engn, Jeonju 54896, South Korea
来源
关键词
MoS2; Top-gate; Field-effect transistor; Ionic liquid; Ion-gel; LAYER MOS2;
D O I
10.5757/ASCT.2021.30.5.156
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Polymer electrolytes and ionic liquids (ILs) have attracted significant interest in applications as gate dielectrics. In this study, we fabricated top-gated molybdenum disulfide (MoS2) thin-film transistors using IL and ion-gel (IG) gate dielectrics. Room-temperature Raman spectra measurements indicated a dominant peak spectral emission at 358 cm(-1) (E-2g(1)) and 406.44 cm(-1) (A(1g)) associated with bilayer MoS2 films. The fabricated thin-film field-effect transistors (FET) with IG gate dielectric exhibited band transport with a highest mobility of 0.5 cm(2)/V.s, and a poor I-ON/I-OFF ratio of similar to 10. By contrast, the FET with IL gate dielectric exhibited a 3400 % improvement in terms of the mobility (17.9 cm(2)/V.s), and a 1000 % improvement of the I-ON/I-OFF ratio (similar to 100).
引用
收藏
页码:156 / 158
页数:3
相关论文
共 50 条
  • [21] Top-gate organic field-effect transistors fabricated on paper with high operational stability
    Wang, Cheng-Yin
    Fuentes-Hernandez, Canek
    Chou, Wen-Fang
    Kippelen, Bernard
    ORGANIC ELECTRONICS, 2017, 41 : 340 - 344
  • [22] Electrical characterization of MoS2 field-effect transistors with different dielectric polymer gate
    Liu, Lan
    Wang, Xudong
    Han, Li
    Tian, Bobo
    Chen, Yan
    Wu, Guangjian
    Li, Dan
    Yan, Mengge
    Wang, Tao
    Sun, Shuo
    Shen, Hong
    Lin, Tie
    Sun, Jinglan
    Duan, Chungang
    Wang, Jianlu
    Meng, Xiangjian
    Chu, Junhao
    AIP ADVANCES, 2017, 7 (06)
  • [23] In Situ 2D MoS2 Field-Effect Transistors with an Electron Beam Gate
    Das, Paul Masih
    Drndic, Marija
    ACS NANO, 2020, 14 (06) : 7389 - 7397
  • [24] Impact of fixed charges at interfaces on the operation of top-gate carbon nanotube field-effect transistors
    Ohno, Yutaka
    Moriyama, Naoki
    Kishimoto, Shigeru
    Mizutani, Takashi
    PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 8, NO 2, 2011, 8 (02): : 567 - 569
  • [25] A new method to invert top-gate organic field-effect transistors for Kelvin probe investigations
    Kehrer, L. A.
    Feldmeier, E. J.
    Siol, C.
    Walker, D.
    Melzer, C.
    von Seggern, H.
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2013, 112 (02): : 431 - 436
  • [26] Top-gate Organic Field-effect Transistors Fabricated on Shape-memory Polymer Substrates
    Choi, Sangmoo
    Fuentes-Hernandez, Canek
    Wang, Cheng-Yin
    Wei, Andrew
    Voit, Walter
    Zhang, Yadong
    Barlow, Stephen
    Marder, Seth R.
    Kippelen, Bernard
    ORGANIC FIELD-EFFECT TRANSISTORS XIV; AND ORGANIC SENSORS AND BIOELECTRONICS VIII, 2015, 9568
  • [27] Persistent Photoconductivity, Hysteresis and Field Emission in MoS2 Back-Gate Field-Effect Transistors
    Di Bartolomeo, Antonio
    Giubileo, Filippo
    Urban, Francesca
    Iemmo, Laura
    Luongo, Giuseppe
    Grillo, Alessandro
    2018 IEEE 13TH NANOTECHNOLOGY MATERIALS AND DEVICES CONFERENCE (NMDC), 2018, : 351 - 352
  • [28] Advantages of top-gate, high-k dielectric carbon nanotube field-effect transistors
    Yang, MH
    Teo, KBK
    Gangloff, L
    Milne, WI
    Hasko, DG
    Robert, Y
    Legagneux, P
    APPLIED PHYSICS LETTERS, 2006, 88 (11)
  • [29] Memory characteristics of top-gate ZnO nanowire field-effect transistors with floating gate nodes of Au nanoparticles
    Yeom, Donghyuk
    Kang, Jeongmin
    Yoon, Changjoon
    Park, Byoungjun
    Keem, Kihyun
    Jeong, Dong-Young
    Kim, Mihyun
    Koh, Eui Kwan
    Kim, Sangsig
    MICROPROCESSES AND NANOTECHNOLOGY 2007, DIGEST OF PAPERS, 2007, : 124 - +
  • [30] Test Structures for Understanding the Impact of Ultra-High Vacuum Metal Deposition on Top-Gate MoS2 Field-Effect-Transistors
    Bolshakov, Pavel
    Zhao, Peng
    Smyth, Christopher M.
    Azcatl, Angelica
    Wallace, Robert M.
    Young, Chadwin D.
    Hurley, Paul K.
    2017 INTERNATIONAL CONFERENCE OF MICROELECTRONIC TEST STRUCTURES (ICMTS), 2017,