System-level performance evaluation of three-dimensional integrated circuits

被引:115
|
作者
Rahman, A [1 ]
Reif, R [1 ]
机构
[1] MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA
关键词
critical-path; performance; SLIP99 : system level interconnect; VLSI;
D O I
10.1109/92.902261
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, the wire (interconnect)-length distribution of three-dimensional (3-D) integrated circuits (ICs) is derived using Rent's Rule and following the methodology used to estimate two-dimensional (2-D) (wire-length distribution [1]). Two limiting Eases of connectivity between logic gates on different device layers are examined by comparing the wire-length distribution and average and total wire-length. System performance metrics such as dock frequency, chip area, etc. are estimated using wire-length distribution, interconnect delay criteria, and simple models representing the cost or complexity for manufacturing 3-D ICs, The technology requirement for interconnects in 3-D integration is also discussed.
引用
收藏
页码:671 / 678
页数:8
相关论文
共 50 条
  • [31] Coupled simulation of device performance and heating of vertically stacked three-dimensional integrated circuits
    Akturk, A
    Goldsman, N
    Metze, G
    [J]. SISPAD: 2005 International Conference on Simulation of Semiconductor Processes and Devices, 2005, : 115 - 118
  • [32] Cost evaluation on reuse of generic network service dies in three-dimensional integrated circuits
    Wu, Ji
    Wang, Gaofeng
    [J]. MICROELECTRONICS JOURNAL, 2013, 44 (02) : 152 - 162
  • [33] Device-level and module-level three-dimensional integrated circuits created using oblique processing
    Burckel, D. Bruce
    [J]. JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2016, 15 (03):
  • [34] Integrated precision evaluation method for three-dimensional optical measurement system
    Zhang, D. H.
    Liang, J.
    Guo, C.
    Chen, Z.
    [J]. PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART B-JOURNAL OF ENGINEERING MANUFACTURE, 2011, 225 (B6) : 909 - 920
  • [35] Special Issue "Building Three-Dimensional Integrated Circuits and Microsystems"
    Zhu, Zhiyuan
    Zhang, Sixiang
    Ma, Shenglin
    Liu, Ziyu
    [J]. PROCESSES, 2023, 11 (03)
  • [36] Monolithic Three-Dimensional Integrated Circuits: Process and Design Implications
    Geng, Hui
    Maresca, Luke
    Cronquist, Brian
    Or-Bach, Zvi
    Shi, Yiyu
    [J]. INTERNATIONAL SYMPOSIUM ON FUNCTIONAL DIVERSIFICATION OF SEMICONDUCTOR ELECTRONICS 2 (MORE-THAN-MOORE 2), 2014, 61 (06): : 3 - 10
  • [37] "Green" On-chip Inductors in Three-Dimensional Integrated Circuits
    Tida, Umamaheswara Rao
    Mittapalli, Varun
    Zhuo, Cheng
    Shi, Yiyu
    [J]. 2014 IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI (ISVLSI), 2014, : 572 - 577
  • [38] A Floorplanning Algorithm for Novel Three-dimensional Nano Integrated Circuits
    Luo, Rong
    Zhang, Xi
    Shi, Shengqing
    Sun, Peng
    [J]. 53RD IEEE INTERNATIONAL MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, 2010, : 857 - 860
  • [39] Integration schemes and enabling technologies for three-dimensional integrated circuits
    Chen, K. N.
    Tan, C. S.
    [J]. IET COMPUTERS AND DIGITAL TECHNIQUES, 2011, 5 (03): : 160 - 168
  • [40] Routing Complexity Minimization of Monolithic Three-Dimensional Integrated Circuits
    Lin, Sheng-En
    Kim, Dae Hyun
    [J]. PROCEEDINGS OF THE 2019 20TH INTERNATIONAL SYMPOSIUM ON QUALITY ELECTRONIC DESIGN (ISQED), 2019, : 329 - 334