System-level performance evaluation of three-dimensional integrated circuits

被引:115
|
作者
Rahman, A [1 ]
Reif, R [1 ]
机构
[1] MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA
关键词
critical-path; performance; SLIP99 : system level interconnect; VLSI;
D O I
10.1109/92.902261
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
In this paper, the wire (interconnect)-length distribution of three-dimensional (3-D) integrated circuits (ICs) is derived using Rent's Rule and following the methodology used to estimate two-dimensional (2-D) (wire-length distribution [1]). Two limiting Eases of connectivity between logic gates on different device layers are examined by comparing the wire-length distribution and average and total wire-length. System performance metrics such as dock frequency, chip area, etc. are estimated using wire-length distribution, interconnect delay criteria, and simple models representing the cost or complexity for manufacturing 3-D ICs, The technology requirement for interconnects in 3-D integration is also discussed.
引用
收藏
页码:671 / 678
页数:8
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