In-Situ observations of grain boundary migration in aluminium analysed with fully automated EBSP orientation mapping in SEM.

被引：0
|
作者：
Kobberrod, OK [1 ]
Johannessen, K [1 ]
Heiberg, G [1 ]
Hjelen, J [1 ]
机构：
[1] Royal Norwegian Air Force Acad, N-7004 Trondheim, Norway
来源：
ELECTRON MICROSCOPY 1998, VOL 3: MATERIALS SCIENCE 2 | 1998年
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中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
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页码：543 / 544
页数：2
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