In-situ observations and measurements of mechanically induced grain boundary migration in a scanning electron microscope

被引：2

作者：

Gorkaya, Tatiana ^{[1
]}

Burlet, Thomas ^{[1
]}

Molodov, Dmitri A. ^{[1
]}

Gottstein, Guenter ^{[1
]}

机构：

[1] Rhein Westfal TH Aachen, Inst Phys Met & Met Phys, D-52056 Aachen, Germany

来源：

RECRYSTALLIZATION AND GRAIN GROWTH IV | 2012年 / 715-716卷

关键词：

Grain boundary migration; In situ observation; Bicrystal; Shear stress; SLIDING BEHAVIOR; SYMMETRIC TILT; MOTION;

D O I：

10.4028/www.scientific.net/MSF.715-716.819

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A novel set-up developed to continuously observe and measure stress driven grain boundary migration is presented. A commercially available tensile/compression SEM unit was utilized for in-situ observations of mechanically loaded samples at elevated temperatures up to 850 degrees C by recording orientation contrast images of bicrystal surfaces. Two sample holders for application of a shear stress to the boundary in bicrystals of different geometry were designed and fabricated. The results of first measurements are presented.

引用

页码：819 / 824

页数：6

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