Cleaning of cantilevers for atomic force microscopy in supercritical carbon dioxide

被引：2
|
作者：
Timashev, P. S. [1 ]
Kotova, S. L. [2 ]
Glagolev, N. N. [2 ]
Aksenova, N. A. [2 ]
Solovieva, A. B. [2 ]
Bagratashvili, V. N. [1 ]
机构：
[1] Russian Acad Sci, Inst Laser & Informat Technol, Moscow, Russia
[2] Russian Acad Sci, Semenov Inst Chem Phys, Moscow, Russia
来源：
RUSSIAN JOURNAL OF PHYSICAL CHEMISTRY B | 2014年 / 8卷 / 08期
基金：
俄罗斯基础研究基金会;
关键词：
atomic force microscopy; cantilevers; surface cleaning; supercritical carbon dioxide;
D O I：
10.1134/S1990793114080168
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
A method of nondestructive cleaning of probes for atomic force microscopy (AFM) in supercritical carbon dioxide (SC-CO2) was suggested. The artificial organic contaminant (polyethylmethacrylate) was removed with SC-CO2 without any damage to the structure of the probe and the initial characteristics of the probe were restored. The Raman and scanning electron microscopy studies showed that the probe surface was completely cleaned as a result of treatment in SC-CO2; the bands of the initial contaminant vanished from the Raman spectra. The images of the calibration gratings obtained using the probes cleaned in SC-CO2 were more distinct, with clear-cut boundaries of the objects and reduced numbers of "artefact" bands compared with images obtained with the initial nonused probes.
引用
收藏
页码：1081 / 1086
页数：6
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