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- [32] Electromigration-induced drift in Damascene vs. Conventional interconnects: An intrinsic difference MATERIALS RELIABILITY IN MICROELECTRONICS VIII, 1998, 516 : 89 - 94
- [38] Head vs. Eye-Based Selection in Virtual Reality SUI'17: PROCEEDINGS OF THE 2017 SYMPOSIUM ON SPATIAL USER INTERACTION, 2017, : 151 - 151