Dewetting of thin polymer films: an X-ray scattering study

被引：39
|
作者：
Muller-Buschbaum, P [1 ]
Stamm, M [1 ]
机构：
[1] Max Planck Inst Polymerforsch, D-55021 Mainz, Germany
来源：
PHYSICA B | 1998年 / 248卷
关键词：
dewetting; polymer; diffuse scattering; SFM;
D O I：
10.1016/S0921-4526(98)00238-5
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The surface morphology of different dewetting states of thin polymer films (polystyrene) on top of silicon substrates was investigated. With diffuse X-ray scattering in the region of total external reflection a high in-plane resolution was achieved. We observe a new nano-dewetting structure which coexists with the well known mesoscopic dewetting structures of holes, cellular pattern and drops. This nano-dewetting structure consists of small dimples with a diameter in the nanometer range. It results from the dewetting of a remaining ultra-thin polymer layer and can be explained with theoretical predictions of spinodal decomposition. The experimental results of the scattering study are confirmed with scanning-force microscopy measurements. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码：229 / 237
页数：9
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