Optimization in fabricating skutterudite CoSb3 thermoelectric thin films

被引:7
|
作者
Zheng, Zhuang-hao [1 ,2 ]
Wei, Meng [1 ]
Li, Fu [1 ]
Luo, Jing-ting [1 ]
Ma, Hong-li [2 ]
Liang, Guang-xing [1 ,2 ]
Zhang, Xiang-hua [2 ]
Fan, Ping [1 ]
机构
[1] Shenzhen Univ, Inst Thin Film Phys & Applicat, Coll Phys & Energy, Shenzhen Key Lab Adv Thin Films & Applicat, Shenzhen 518060, Peoples R China
[2] Univ Rennes 1, Inst Chem Sci, Lab Glasses & Ceram, CNRS,UMR 6226, F-35042 Rennes, France
基金
中国国家自然科学基金;
关键词
FIGURE; MERIT;
D O I
10.1007/s10854-017-7652-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
CoSb3 based thin films were prepared at room temperature by radio-frequency sputtering and the CoSb3 alloy targets were used with the Co:Sb atomic ratio of 1:3, 1:3.5 and 1:4, respectively. Then the as-deposited thin films were annealed at 300 and 325 degrees C under argon atmosphere for 1 h. It can be found that the thin films have single skutterudite phase structure when used the Co:Sb (1:3.5) alloy target. Though other films show the primary CoSb3 phase structure, there are some impurity phases can be observed from the X-ray diffraction patterns. For contrast, the thin films prepared by the Co:Sb (1:3.5) alloy target were annealed from 250 to 350 degrees C with the temperature interval of 25 degrees C. The results show that the thin film annealed at 325 degrees C has the best thermoelectric performance.
引用
收藏
页码:17221 / 17226
页数:6
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