Fabrication of diamond tip cantilever and its application to tribo-nanolithography

被引:0
|
作者
Park, JK [1 ]
Park, JW [1 ]
机构
[1] Korea Inst Machinery & Mat, Dept Intelligence & Precis Machine, Taejon, South Korea
关键词
nano-scale fabrication; AFM (atomic force microscope); cantilever; diamond tip; TNL (Tribonanolithography);
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Nano-scale fabrication of silicon substrate based on the use of atomic force microscopy (AFM) was demonstrated. A specially designed cantilever with diamond tip, allowing the formation of damaged layer on silicon substrate by a simple scratching process, has been applied instead of conventional silicon cantilever for scanning. A thin damaged layer forms in the substrate at the diamond tip-sample junction along scanning path of the tip. The damaged layer withstands against wet chemical etching in aqueous KOH solution. Diamond tip acts as a patterning tool like mask film for lithography process. Hence these sequential processes, called tribo-nanolithography, TNL, can fabricate 2D or 3D micro structures in nanometer range. This study demonstrates the novel fabrication processes of the micro cantilever and diamond tip as a tool for TNL using micro-patterning, wet chemical etching and CVD. The developed TNL tools show outstanding machinability against single crystal silicon wafer. Hence, they are expected to have a possibility for industrial applications as a micro-to-nano machining tool.
引用
收藏
页码:695 / 700
页数:6
相关论文
共 50 条
  • [11] Study on tribo-fabrication in polishing by nano diamond colloid
    Lin, W.M.
    Kato, T.
    Ohmori, H.
    Osawa, E.
    Key Engineering Materials, 2009, 404 : 131 - 136
  • [12] Superlubricity between a silicon tip and graphite enabled by the nanolithography-assisted nanoflakes tribo-transfer
    Sha, Tian-Dong
    Pang, Hua
    Fang, Liang
    Liu, Hui-Xian
    Chen, Xin-Chun
    Liu, Da-Meng
    Luo, Jian-Bin
    NANOTECHNOLOGY, 2020, 31 (20)
  • [13] Diamond tip cantilever for micro/nano machining based on AFM
    Park, JW
    Lee, DW
    Takano, N
    Morita, N
    PROGRESS ON ADVANCED MANUFACTURE FOR MICRO/NANO TECHNOLOGY 2005, PT 1 AND 2, 2006, 505-507 : 79 - 84
  • [14] Fabrication of piczoresistive sensed AFM cantilever probe with integrated tip
    Rangelow, IW
    Shi, F
    Hudek, P
    Gotszalk, T
    Grabiec, PB
    Dumania, P
    MICROMACHINING AND MICROFABRICATION PROCESS TECHNOLOGY II, 1996, 2879 : 56 - 64
  • [15] Fabrication of gold nanoelectrodes based on nanolithography electrochemically through a conductive AFM tip
    Li, TF
    Zhang, XT
    Jiang, XH
    Li, YC
    Du, ZL
    CHINESE SCIENCE BULLETIN, 2005, 50 (22): : 2560 - 2564
  • [17] Diamond - Application to piezoelectric bimorph cantilever sensors
    Mortet, V.
    Haenen, K.
    Potmesil, J.
    Vanecek, M.
    D'Olieslaeger, M.
    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2006, 203 (12): : 3185 - 3190
  • [18] Scanning diamond probe and application to thermo-mechanical nanolithography
    Bae, JH
    Ono, T
    Konoma, C
    Esashi, M
    MEMS-03: IEEE THE SIXTEENTH ANNUAL INTERNATIONAL CONFERENCE ON MICRO ELECTRO MECHANICAL SYSTEMS, 2003, : 24 - +
  • [19] Fabrication of diamond-like amorphous carbon cantilever resonators
    Chua, DHC
    Milne, WI
    Sheeja, D
    Tay, BK
    Schneider, D
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2004, 22 (06): : 2680 - 2684
  • [20] Microfabricated cantilever with metallic tip for electrostatic and capacitance microscopy and its application to investigation of semiconductor devices
    Gotszalk, T
    Czarnecki, P
    Grabiec, P
    Domanski, K
    Zaborowski, M
    Rangelow, IW
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2004, 22 (02): : 506 - 509