Multi-layer ceramic capacitor (MLCC)termination height - Effect on electrical performance

被引：1
|
作者：
Stewart, M [1 ]
Linton, D [1 ]
机构：
[1] AVX Kyocera, Coleraine BT52 2DA, Londonderry, North Ireland
来源：
2003 HIGH FREQUENCY POSTGRADUATE STUDENT COLLOQUIUM | 2003年
关键词：
D O I：
10.1109/HFPSC.2003.1242322
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper investigates the influence of metal termination height (H) on a multi-layer ceramic capacitor (Fig. 1) and its overall electrical response. Since the path to the active layers of the capacitor is via a block of highly conductive metal, it is of interest to determine the effect this has on the capacitors' overall performance. A mixture of theory, simulation, and measurement will be used to validate and refine the individual component parameter of inductance per unit height for commercial MLCCs in the frequency range to 10 GHz.
引用
收藏
页码：124 / 127
页数：4
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