Chemical state analysis in air by high-resolution PIXE

被引：14
|
作者：
Maeda, K [1 ]
Hasegawa, K
Hamanaka, H
Maeda, M
机构：
[1] RIKEN, Inst Phys & Chem Res, Wako, Saitama 35101, Japan
[2] Hosei Univ, Coll Engn, Koganei, Tokyo 184, Japan
[3] Tokyo Univ Fisheries, Minato Ku, Tokyo 108, Japan
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1998年 / 136卷
关键词：
in-air PIXE; high-resolution PIXE; chemical state analysis;
D O I：
10.1016/S0168-583X(97)00820-3
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A crystal spectrometer system was arranged at an external proton beam to measure the K X-ray spectra for various compounds of Al, Si, P and S at atmospheric pressure, Satellite structures of the K beta spectra caused by molecular-orbital splittings are well resolved, The results demonstrate that in situ chemical state analysis has now been possible using this in-air high-resolution PIXE system. (C) 1998 Elsevier Science B.V.
引用
收藏
页码：994 / 999
页数：6
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