Results from the D0 silicon vertex detector beam tests

被引:1
|
作者
Roco, MTP [1 ]
机构
[1] Fermi Natl Accelerator Lab, Batavia, IL 60510 USA
关键词
D O I
10.1016/S0168-9002(98)00721-9
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Extensive tests of the DO silicon vertex detectors and the final version of the SVX-II chip and readout electronics were performed at a test beam facility equipped with a 2T magnet at FNAL. Preliminary results are reported on the performance of the SVX-II chip, charge collection properties, signal to noise ratio, cluster pulse height and spatial resolution. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:91 / 96
页数:6
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