Gate insulators and interface effects in organic thin-film transistors

被引:20
|
作者
Yildirim, F. A. [1 ]
Schliewe, R. R. [1 ]
Bauhofer, W. [1 ]
Meixner, R. M. [2 ]
Goebel, H. [2 ]
Krautschneider, W. [3 ]
机构
[1] Hamburg Univ Technol, Inst Opt & Elect Mat, D-21073 Hamburg, Germany
[2] Univ Fed Armed Forces, Helmut Schmidt Univ, Dept Elect, D-22043 Hamburg, Germany
[3] Hamburg Univ Technol, Inst Nanoelect, D-21073 Hamburg, Germany
关键词
organic thin-film transistor; P3HT; polymer dielectric; interface; solvents;
D O I
10.1016/j.orgel.2007.09.005
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper presents a detailed characterization of different thermosetting polymers to be used as gate dielectrics in organic thin-film transistors. Selected materials yield smooth films with good insulation properties and offer attractive processing conditions. Bottom-gate transistors were prepared using these dielectrics and compared to hybrid transistors with surface-treated SiO2 as the dielectric. Gate bias induced leakage and solvent effects were investigated by preparing metal/ insulator/semiconductor devices. Poly(3-hexylthiophene) (P3HT) transistors with organic dielectrics exhibited higher channel conductivity and lower mobility values with respect to P3HT-hybrid transistors and pentacene transistors. The importance of dielectric/semiconductor interface was discussed by comparing the performances of pentacene and P3HT transistors produced on different dielectrics. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:70 / 76
页数:7
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