X-ray microscopes at BESSY II

被引：0
|
作者：
Guttmann, P [1 ]
Niemann, B [1 ]
Thieme, J [1 ]
Wiesemann, U [1 ]
Rudolph, D [1 ]
Schmahl, G [1 ]
机构：
[1] Univ Gottingen, Inst XRay Phys, D-37073 Gottingen, Germany
来源：
X-RAY MICROSCOPY, PROCEEDINGS | 2000年 / 507卷
关键词：
D O I：
暂无
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
The undulator U41 at BESSY II will be used as Source for X-ray microscopes. An overview of the X-ray microscopy area is presented. After finishing the construction phase a transmission X-ray microscope, a scanning transmission X-ray microscope and an X-ray test chamber will be available. The transmission X-ray microscope will allow investigations with hi-h lateral resolution at moderate energy resolution while the scanning transmission X-ray microscope will allow high energy resolution at moderate lateral resolution of the same specimen.
引用
收藏
页码：411 / 415
页数：5
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