Frequency shift, damping, and tunneling current coupling with quartz tuning forks in noncontact atomic force microscopy

被引:10
|
作者
Nony, Laurent [1 ]
Bocquet, Franck
Para, Franck
Loppacher, Christian
机构
[1] Aix Marseille Univ, IM2NP, Ctr Sci St Jerome, Ave Escadrille Normandie Niemen,Case 151, F-13397 Marseille 20, France
关键词
SCANNING PROBE MICROSCOPY; SINGLE-MOLECULE; RESOLUTION; SPECTROSCOPY; SI(111); SURFACE; LIMITS; FIELD;
D O I
10.1103/PhysRevB.94.115421
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A combined experimental and theoretical approach to the coupling between frequency-shift (Delta f), damping, and tunneling current (I-t) in combined noncontact atomic force microscopy/scanning tunneling microscopy using quartz tuning forks (QTF)-based probes is reported. When brought into oscillating tunneling conditions, the tip located at the QTF prong's end radiates an electromagnetic field which couples to the QTF prong motion via its piezoelectric tensor and loads its electrodes by induction. Our approach explains how those I-t-related effects ultimately modify the Delta f and the damping measurements. This paradigm to the origin of the coupling between I-t and the nc-AFM regular signals relies on both the intrinsic piezoelectric nature of the quartz constituting the QTF and its electrodes design.
引用
收藏
页数:15
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