Generalized likelihood ratio tests for the structure of semiparametric additive models

被引:25
|
作者
Jiang, Jiancheng [1 ]
Zhou, Haibo
Jiang, Xuejun
Peng, Jianan
机构
[1] Univ N Carolina, Dept Math & Stat, Charlotte, NC 28223 USA
[2] Univ N Carolina, Dept Biostat, Chapel Hill, NC 27599 USA
[3] Chinese Univ Hong Kong, Hong Kong, Hong Kong, Peoples R China
[4] Acadia Univ, Dept Math & Stat, Wolfville, NS B4P 2R6, Canada
关键词
backfitting algorithm; generalized likelihood ratio; local polynomial regression; wilks phenomenon;
D O I
10.1002/cjs.5550350304
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
Semiparametric additive models (SAMs) are very useful in multivariate nonparametric regression. In this paper, the authors study nonparametric testing problems for the nonparametric components of SAMs. Using the backfitting algorithm and the local polynomial smoothing technique, they extend to SAMs the generalized likelihood ratio tests of Fan & Jiang (2005). The authors show that the proposed tests possess the Wilks-type property and that they can detect alternatives nearing the null hypothesis with a rate arbitrarily close to root-n while error distributions are unspecified. They report simulations which demonstrate the Wilks phenomenon and the powers of their tests. They illustrate the performance of their approach by simulation and using the Boston housing data set.
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页码:381 / 398
页数:18
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