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Ranking and selection techniques with overlapping variance estimators
被引:0
|作者:
Healey, Christopher
[1
]
Goldsman, David
[1
]
Kim, Seong-Hee
[1
]
机构:
[1] Georgia Inst Technol, H Milton Stewart Sch Ind & Syst Engn, Atlanta, GA 30332 USA
关键词:
D O I:
暂无
中图分类号:
TP39 [计算机的应用];
学科分类号:
081203 ;
0835 ;
摘要:
Some ranking and selection (R&S) procedures for steady-state simulation require an estimate of the asymptotic variance parameter of each system to guarantee a certain probability of correct selection. We show that the performance of such R&S procedures depends on the quality of the variance estimates that are used. In this paper, we study the performance of R&S procedures with two new variance estimators - overlapping area and overlapping Cramer-von Mises estimators - which show better long-run performance than other estimators previously used in R&S problems.
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页码:501 / 508
页数:8
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