A COSET PATTERN IDENTITY BETWEEN A 2n-p DESIGN AND ITS COMPLEMENT

被引：0

作者：

Zeng, Peng ^{[1
]}

Wan, Hong ^{[2
]}

Zhu, Yu ^{[3
]}

机构：

[1] Auburn Univ, Dept Math & Stat, Auburn, AL 36849 USA

[2] Purdue Univ, Sch Ind Engn, W Lafayette, IN 47907 USA

[3] Purdue Univ, Dept Stat, W Lafayette, IN 47907 USA

来源：

STATISTICA SINICA | 2011年 / 21卷 / 03期

关键词：

Complementary design; coset pattern matrix; fractional factorial design; minimum M-aberration; wordlength pattern; ABERRATION;

D O I：

10.5705/ss.2008.289

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

The coset pattern matrix contains more detailed information about effect aliasing in a factorial design than the commonly used wordlength pattern. More flexible and elaborate design criteria can be proposed using the coset pattern matrix. In this article, we establish an identity that relates the coset pattern matrix of a design to that of its complement. As an application, the identity is used to characterize minimum M-aberration designs through their complements.

引用

页码：1453 / 1471

页数：19

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