Methods for determining and processing 3D errors and uncertainties for AFM data analysis

被引:42
|
作者
Klapetek, P. [1 ]
Necas, D. [2 ]
Campbellova, A. [1 ]
Yacoot, A. [3 ]
Koenders, L. [4 ]
机构
[1] Czech Metrol Inst, Brno 63800, Czech Republic
[2] Masaryk Univ, Fac Sci, Dept Phys Elect, CS-61137 Brno, Czech Republic
[3] Natl Phys Lab, Teddington TW11 0LW, Middx, England
[4] Phys Tech Bundesanstalt, D-38116 Braunschweig, Germany
关键词
atomic force microscopy; 3D calibration; measurement uncertainty; CALIBRATION; MICROSCOPE; METROLOGY;
D O I
10.1088/0957-0233/22/2/025501
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
This paper describes the processing of three-dimensional (3D) scanning probe microscopy (SPM) data. It is shown that 3D volumetric calibration error and uncertainty data can be acquired for both metrological atomic force microscope systems and commercial SPMs. These data can be used within nearly all the standard SPM data processing algorithms to determine local values of uncertainty of the scanning system. If the error function of the scanning system is determined for the whole measurement volume of an SPM, it can be converted to yield local dimensional uncertainty values that can in turn be used for evaluation of uncertainties related to the acquired data and for further data processing applications (e.g. area, ACF, roughness) within direct or statistical measurements. These have been implemented in the software package Gwyddion.
引用
收藏
页数:10
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