Dissipation Energy in Tapping-Mode Atomic Force Microscopes Caused by Liquid Bridge

被引:1
|
作者
Wei, Zheng [1 ]
Wang, Zai-Ran [1 ]
Sun, Yan [1 ]
Xu, Xiang-Hong [2 ]
机构
[1] Beijing Univ Chem Technol, Coll Mech & Elect Engn, Beijing 100029, Peoples R China
[2] Chinese Acad Sci, Inst Mech, State Key Lab Nonlinear Mech, Beijing 100190, Peoples R China
基金
中国国家自然科学基金;
关键词
VOLUME;
D O I
10.1088/0256-307X/35/1/016802
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The dissipation of energy during the process of contact and separation between a tip and a sample is very important for understanding the phase images in the tapping mode of atomic force microscopes (AFMs). In this study, a method is presented to measure the dissipated energy between a tip and a sample. The experimental results are found to be in good agreement with the theoretical model, which indicates that the method is reliable. Also, this study confirms that liquid bridges are mainly produced by extrusion modes in the tapping mode of AFMs.
引用
收藏
页数:4
相关论文
共 50 条
  • [1] Dissipation Energy in Tapping-Mode Atomic Force Microscopes Caused by Liquid Bridge
    魏征
    王再冉
    孙岩
    许向红
    [J]. Chinese Physics Letters, 2018, (01) : 76 - 79
  • [2] Dissipation Energy in Tapping-Mode Atomic Force Microscopes Caused by Liquid Bridge
    魏征
    王再冉
    孙岩
    许向红
    [J]. Chinese Physics Letters., 2018, 35 (01) - 79
  • [3] Energy dissipation in tapping-mode atomic force microscopy
    Cleveland, JP
    Anczykowski, B
    Schmid, AE
    Elings, VB
    [J]. APPLIED PHYSICS LETTERS, 1998, 72 (20) : 2613 - 2615
  • [4] Power dissipation analysis in tapping-mode atomic force microscopy
    Balantekin, M
    Atalar, A
    [J]. PHYSICAL REVIEW B, 2003, 67 (19):
  • [5] Nonlinear dynamics of tapping-mode atomic force microscopy in liquid
    Korayem, M. H.
    Ebrahimi, N.
    [J]. JOURNAL OF APPLIED PHYSICS, 2011, 109 (08)
  • [6] A virtual tapping-mode atomic force microscope
    Zhou, Xianwei
    Fang, Yongchun
    [J]. 2006 1ST IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS, VOLS 1-3, 2006, : 501 - 504
  • [7] A model for impact dynamics and its application to frequency analysis of tapping-mode atomic force microscopes
    Materassi, D
    Basso, M
    Genesio, R
    [J]. 42ND IEEE CONFERENCE ON DECISION AND CONTROL, VOLS 1-6, PROCEEDINGS, 2003, : 6218 - 6223
  • [8] Energy dissipation in tapping-mode scanning force microscopy with low quality factors
    Tamayo, J
    [J]. APPLIED PHYSICS LETTERS, 1999, 75 (22) : 3569 - 3571
  • [9] Energy Dissipated in Tapping Mode Atomic Force Microscopes due to Humidity
    Zheng, Xiaoting
    Sun, Yan
    Wei, Zheng
    [J]. 5TH INTERNATIONAL CONFERENCE ON MECHANICS AND MECHATRONICS RESEARCH (ICMMR 2018), 2018, 417
  • [10] The role of adhesion in tapping-mode atomic force microscopy
    Sarid, D
    Hunt, JP
    Workman, RK
    Yao, X
    Peterson, CA
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S283 - S286