GISAXS Analysis for Ionomer Thin Films

被引：1
|
作者：
Dudenas, P. [1 ,2 ]
Kusoglu, A. [2 ]
Hexemer, A. [2 ]
Weber, A. [2 ]
机构：
[1] Univ Calif Berkeley, Dept Chem Engn, Berkeley, CA 94720 USA
[2] Lawrence Berkeley Natl Lab, 1 Cyclotron Rd, Berkeley, CA 94720 USA
来源：
POLYMER ELECTROLYTE FUEL CELLS 16 (PEFC 16) | 2016年 / 75卷 / 14期
关键词：
X-RAY-SCATTERING; POLYMER-FILMS; NAFION FILMS; ANGLE; MEMBRANES;
D O I：
10.1149/07514.0643ecst
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
An overview of GISAXS analysis for ionomer thin films is presented. Experimental procedures to prepare and measure thin films using GISAXS is described. Typical features of ionomer scattering images are discussed before detailing three different types of analysis which can be used in conjunction with one another to elucidate additional information from scattering patterns. Example data are provided to illustrate these techniques.
引用
收藏
页码：643 / 650
页数：8
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