Satisfiability models for maximum transition power

被引:7
|
作者
Roy, Suchismita [1 ]
Chakrabarti, P. P. [2 ]
Dasgupta, Pallab [2 ]
机构
[1] Natl Inst Technol, Dept Comp Sci & Engn, Durgapur 713209, W Bengal, India
[2] Indian Inst Technol, Dept Comp Sci & Engn, Kharagpur 721302, W Bengal, India
关键词
event modeling; peak transition power; SAT;
D O I
10.1109/TVLSI.2008.2000322
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
A satisfiability-based technique for symbolic modeling of event propagation in a circuit is presented in this paper which captures the events in the internal nodes of the circuit with a high level of detail. The model is used to accurately measure the peak single cycle transition power consumption in combinational and sequential circuits, which is closely affected by the switching activity in the circuit. Our technique is scalable, and adapts easily to ever increasing sizes of the custom cells (building blocks) in today's industry, without compromising on accuracy and correctness.
引用
收藏
页码:941 / 951
页数:11
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