Orientation dependence of dielectric and ferroelectric properties of Pb(Zr0.8Ti0.2)O3/Pb(Zr0.2Ti0.8)O3 multilayered thin films

被引：15
|
作者：
Wu, Jiagang [1 ]
Xiao, Dingquan [1 ]
Zhu, Jiliang [1 ]
Zhu, Jianguo [1 ]
机构：
[1] Sichuan Univ, Dept Mat Sci, Chengdu 610064, Peoples R China
来源：
APPLIED PHYSICS LETTERS | 2007年 / 91卷 / 19期
基金：
中国国家自然科学基金;
关键词：
D O I：
10.1063/1.2807839
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The Pb(Zr1-xTix)O-3 multilayered films consisting of Pb(Zr0.8Ti0.2)O-3 and Pb(Zr0.2Ti0.8)O-3 layers with different orientations were deposited by radio frequency magnetron sputtering with PbOx and LaNiO3 (LNO) buffer layers. The PbOx and LNO buffer layers lead to the (001)/(100) and (101)/(110) orientations of the multilayered films, respectively. The orientation dependence of electrical properties of the multilayered films was investigated. Enhanced remnant polarization (2P(r)=79.3 mu C/cm(2)) and dielectric constant (epsilon(r)=857) were obtained for the multilayered films with (001)/(100) orientation as compared to those of the multilayered films with other orientations. These results reveal that the orientation control is important in obtaining good electrical properties.
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页数：3
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