Magnetoresistance of magnetite thin films grown by pulsed laser deposition on GaAs(100) and Al2O3(0001)

被引:5
|
作者
Parames, M. L. [1 ,2 ]
Viskadourakis, Z. [3 ,4 ,5 ]
Giapintzakis, J. [3 ]
Rogalski, M. S. [6 ,7 ]
Conde, O. [1 ,2 ]
机构
[1] Univ Lisbon, Dept Phys, P-1749016 Lisbon, Portugal
[2] ICEMS, P-1749016 Lisbon, Portugal
[3] Univ Cyprus, Dept Mech & Manufacturing Engn, CY-1678 Nicosia, Cyprus
[4] Univ Crete, Dept Mat Sci & Technol, Iraklion 71003, Greece
[5] FORTH, Iraklion 71003, Greece
[6] Inst Super Tecn, Dept Phys, P-2780 Oeiras, Portugal
[7] ICEMS, P-2780 Oeiras, Portugal
关键词
Fe3O4 thin films; gallium arsenide; sapphire; PLD; magnetoresistance;
D O I
10.1016/j.apsusc.2007.08.073
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Magnetotransport properties of magnetite thin films deposited on gallium arsenide and sapphire substrates at growth temperatures between 473 and 673 K are presented. The films were grown by UV pulsed laser ablation in reactive atmospheres Of O-2 and Ar, at working pressure of 8 x 10(-2) Pa. Film stoichiometry was determined in the range from Fe2.95O4 to Fe2.97O4. Randomly oriented polycrystalline thin films were grown on GaAs(1 0 0) while for the Al2O3(0 0 0 1) substrates the films developed a (I 1 1) preferred orientation. Interfacial Fe3+ diffusion was found for both substrates affecting the magnetic behaviour. The temperature dependence of the resistance and magnetoresistance of the films were measured for fields up to 6 T. Negative magnetoresistance values of similar to 5% at room temperature and similar to 10% at 90 K were obtained for the as-deposited magnetite films either on GaAs(1 0 0) or Al2O3(0 0 0 1) (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:1255 / 1259
页数:5
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