Light scattering on random dielectric layers

被引:0
|
作者
Fialko, O. [1 ]
Ziegler, K. [1 ]
机构
[1] Univ Augsburg, Inst Phys, D-86135 Augsburg, Germany
关键词
light scattering; random layers; Anderson localization;
D O I
10.1016/j.jqsrt.2008.04.006
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Scattering of light by a random stack of dielectric layers represents a one-dimensional scattering problem, where the scattered field is a three-dimensional vector field. We investigate the dependence of the scattering properties (hand gaps and Anderson localization) on the wavelength, strength of randoniness and relative angle of the incident wave. There is a characteristic angular dependence of Anderson localization for wavelengths close to the thickness of the layers. In particular, the localization length varies non-monotonously With the angle. In contrast to Anderson localization, absorptive layers do not have this characteristic angular dependence. (C) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2329 / 2337
页数:9
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