THE STUDY OF AGING FREQUENCY DRIFT MECHANISM FOR QUARTZ CRYSTAL RESONATORS

被引:0
|
作者
Yin, Xiao-san [1 ]
Shen, Chun-nan [1 ]
机构
[1] TXC Ningbo Corp, Ningbo 315800, Zhejiang, Peoples R China
关键词
Aging; Frequency drift; Stress; Out-gas; Mounting type;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Aging as long-term stability is one of the most important characteristics of quartz crystal resonators, and stress and out-gas make major contributions. In this paper, aging frequency drift mechanisms under different conditions of mounting types and aging temperatures are analyzed. The results show that the frequency drift under 85 degrees C aging of both two-point and four-point mounted quartz chip are similar; however, the stability performance under 150 degrees C aging of two-point mounted resonator is much better than that of four-point mounted ones. The main reason is the aging curve of two-point mounted resonator is a comprehensive aging curve, since effects of out-gas and stress are balanced well, which is supported by the IVA test.
引用
收藏
页码:379 / 382
页数:4
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