Crystalline orientation of BiMnO3 thin films grown by rf-sputtering

被引：4
|
作者：
Kaul, E. E. [1 ]
Haberkorn, N.
Guimpel, J.
机构：
[1] Comis Nacl Energia Atom, Ctr Atom Bariloche, RA-8400 San Carlos De Bariloche, Rio Negro, Argentina
[2] Comis Nacl Energia Atom, Inst Balseiro, San Carlos De Bariloche, Rio Negro, Argentina
[3] Univ Nacl Cuyo, San Carlos De Bariloche, Rio Negro, Argentina
来源：
APPLIED SURFACE SCIENCE | 2007年 / 254卷 / 01期
关键词：
multiferroic materials; BiMnO3; multiferroism; thin films; magnetoelectric; rf-sputtering;
D O I：
10.1016/j.apsusc.2007.07.012
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
BiMnO3 thin films were deposited by means of rf-sputtering onto [1 0 0] oriented SrTiO3 substrates. X-ray diffraction measurements revealed epitaxial growth with [0 0 1](m) orientation in the monoclinic structure representation, equivalent to the [1 1 1](pc) direction of the pseudocubic cationic lattice. This [0 0 1](m) orientation was obtained in a wide deposition parameters range. Preliminary magnetization measurements suggest that these films do not present ferromagnetism below the bulk Curie temperature, T-c = 105 K. (C) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码：160 / 163
页数：4
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