A semianalytical parameter-extraction procedure for HBT equivalent circuit

被引:58
|
作者
Li, B
Prasad, S
Yang, LW
Wang, SC
机构
[1] Northeastern Univ, Dept Elect & Comp Engn, Boston, MA 02115 USA
[2] Northeastern Univ, Dept Elect & Comp Engn, Boston, MA 02115 USA
[3] TRW Co Inc, Redondo Beach, CA 90278 USA
[4] Lockheed Sanders, Nashua, NH 03060 USA
基金
美国国家科学基金会;
关键词
heterojunction bipolar transistor; parameter extraction; semianalytical method;
D O I
10.1109/22.721144
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A parameter-extraction approach for the heterojunction bipolar transistor (HBT), which combines the analytical approach and empirical optimization procedure, is developed, The extraction techniques for extrinsic base-collector capacitance and pad parasitics are also included in this approach. The cutoff operation of the HBT's is utilized to extract the values of the pad capacitances. An excellent fit between measured and simulated S-parameters in the frequency range of 50 MHz-36 GHz is obtained over a wide range of bias points.
引用
收藏
页码:1427 / 1435
页数:9
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