Simulation of Two Sine Waves' Radiation

被引：0
|
作者：
Zhao, Guoliang [1 ]
Wei, Guanghui [1 ]
Lu, Xinfu [1 ]
机构：
[1] Mech Engn Coll, Res Inst Electrostat & Electromagnet Protect, Shijiazhuang 050003, Peoples R China
来源：
INTERNATIONAL CONFERENCE ON COMPUTATIONAL AND INFORMATION SCIENCES (ICCIS 2014) | 2014年
关键词：
LATENT DAMAGE; RELIABILITY;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
In this paper, a simulation method was designed to investigate the radiation of two sine waves on electronic equipment. Results of the simulation indicated that the co-action of two sine waves could affect the equipment. Regulation of the two sine waves' effects on equipment is related to their frequencies.
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页码：624 / 629
页数：6
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