Free space scalar measurement of microwave reflection coefficients

被引：0
|
作者：
BenlarbiDelai, A
Covillers, JP
Leroy, Y
机构：
[1] Inst. d'Electron. Microlectron. N., Dept. Hyperfrequences S., Univ. des Sci. et Technol. de Lille, 59652 Villeneuve d'Ascq Cedex, Avenue Poincaré
来源：
ELECTRONICS LETTERS | 1996年 / 32卷 / 04期
关键词：
microwave measurement;
D O I：
10.1049/el:19960259
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The authors present a new measurement method for the microwave reflection coefficient modulus (for normal incidence) of a flat surface, using an antenna at a distance between several decimetres and Im. This method is based on interference between the signals resulting from the reflection coefficient of the material and the mismatch of the transmitting-receiving antenna.
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页码：359 / 360
页数：2
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