Two-photon fluorescence scanning near-field microscopy based on a focused evanescent field under total internal reflection

被引:26
|
作者
Chon, JWM
Gu, M
Bullen, C
Mulvaney, P
机构
[1] Swinburne Univ Technol, Sch Biophys Sci & Elect Engn, Ctr Micro Photon, Hawthorn, Vic 3122, Australia
[2] Univ Melbourne, Sch Chem, Parkville, Vic 3010, Australia
关键词
D O I
10.1364/OL.28.001930
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We present two-photon fluorescence near-field microscopy based on an evanescent field focus produced by a ring beam under total internal reflection. The evanescent field produced by this method is focused by a high-numerical-aperture objective, producing a tightly confined volume that can effectively induce two-photon excitation. The imaging system is, characterized by the two-photon-excited images of the nanocrystals, which show that the focused evanescent field is split into two lobes because of the enhancement of the longitudinal polarization component at the focus. This feature is confirmed by the theoretical prediction. Unlike other two-photon near-field probes, this method does not have the heating effect and requires no control mechanism of the distance between a sample and the probe. (C) 2003 Optical Society of America.
引用
收藏
页码:1930 / 1932
页数:3
相关论文
共 50 条
  • [41] Fluorescence scanning near-field optical microscopy of polyfluorene composites
    Stevenson, R
    Milner, RG
    Richards, D
    Arias, AC
    Mackenzie, JD
    Halls, JJM
    Friend, RH
    Kang, DJ
    Blamire, M
    JOURNAL OF MICROSCOPY, 2001, 202 (02) : 433 - 438
  • [42] Scanning near-field fluorescence resonance energy transfer microscopy
    Vickery, SA
    Dunn, RC
    BIOPHYSICAL JOURNAL, 1999, 76 (04) : 1812 - 1818
  • [43] Fluorescence lifetime imaging with near-field scanning optical microscopy
    Kwak, ES
    Kang, TJ
    Bout, DAV
    ANALYTICAL CHEMISTRY, 2001, 73 (14) : 3257 - 3262
  • [44] Internal reflection mode scanning near-field optical microscopy with the tetrahedral tip on metallic samples
    Ferber, J
    Fischer, UC
    Hagedorn, N
    Fuchs, H
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1999, 69 (06): : 581 - 589
  • [45] Internal reflection mode scanning near-field optical microscopy with the tetrahedral tip on metallic samples
    J. Ferber
    U.C. Fischer
    N. Hagedorn
    H. Fuchs
    Applied Physics A, 1999, 69 : 581 - 589
  • [46] REFLECTION NEAR-FIELD OPTICAL MICROSCOPY
    SPAJER, M
    COURJON, D
    SARAYEDDINE, K
    JALOCHA, A
    VIGOUREUX, JM
    JOURNAL DE PHYSIQUE III, 1991, 1 (01): : 1 - 12
  • [47] Super-resolution imaging and spectroscopy of Au25 nanoclusters using two-photon excited fluorescence near-field scanning optical microscopy
    Abeyasinghe, Neranga
    Kumar, Santosh
    Wu, Rosina Ho
    Jin, Rongchao
    Goodson, Theodore
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2015, 250
  • [48] Imaging the internal structure of recording marks on an optical disc by internal reflection scanning near-field optical microscopy
    Schüttler, M
    Leuschner, M
    Giessen, H
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1999, 38 (12A): : L1463 - L1465
  • [49] SCANNING NEAR-FIELD OPTICAL MICROSCOPY (SNOM) IN REFLECTION OR SCANNING OPTICAL TUNNELING MICROSCOPY (SOTM)
    FISCHER, UC
    DURIG, UT
    POHL, DW
    SCANNING MICROSCOPY, 1989, 3 (01) : 1 - 7
  • [50] Resolution of Internal Total ReflectionScanning Near-field Optical Microscopy
    GE Huayong GUO Qizhi TAN Weihan (Department of Physics
    Chinese Journal of Lasers, 2002, (02) : 33 - 38