Raman spectroscopy with simultaneous measurement of two orthogonally polarized Raman spectra

A Raman microscope was modified to allow the independent acquisition of two orthogonally polarized components of a Raman spectrum in a single measurement. Preliminary performance was demonstrated by simultaneously measuring the intensity of both polarized components of the silicon Raman band at 520 cm(-1) as a silicon wafer was rotated through 360degrees under a polarized laser Raman probe. Polarization-resolved Raman spectra of a complex molecular crystal are also presented, illustrating the increase in spectral information available with the modified system. Copyright (C) 2003 John Wiley Sons, Ltd.