Spectroscopic and electrical characterization of buried metal interfaces: Metal-molecule-silicon structures

被引：0
|
作者：
Richter, LJ
Richter, CA
Hacker, CA
机构：
[1] NIST, Surface & Microanal Sci Div, Gaithersburg, MD 20899 USA
[2] Natl Inst Stand & Technol, Div Semicond Elect, Gaithersburg, MD USA
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 2005年 / 229卷
关键词：
D O I：
暂无
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
360-COLL
引用
收藏
页码：U704 / U705
页数：2
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